D1) Knowledge and understanding: the student will acquire the knowledge of the general aspects of the interaction of radiation with matter at the basis of the main X-ray/visible spectroscopy techniques applied to the study of the electronic and structural properties of materials and in particular of the organo-metallic interfaces.

D2) Applying knowledge and understanding: the student will successfully apply the acquired knowledge to the comprehension of the scope of the scientific papers in the field. In particular, the student will be able to identify the spectroscopic techniques useful for studying specific electronic properties of molecular systems and organic-inorganic interfaces.

D3) Making judgements: the student will be able to make judgements on problems involving the tackled systems and on the possible applications of X-ray spectroscopy to the study of complex interfaces.

D4) Communication skills: the student will acquire the proper communication skills to discuss the X-ray spectroscopy study of complex organo-metallic interfaces.

D5) Learning skills: the student will be able to deepen autonomously the knowledge of topics related to the x-ray spectroscopy characterization of complex interfaces, by reading scientific papers or textbooks.

Fundamentals of quantum mechanics and electromagnetism.

Interaction of radiation with matter applied to the understanding of the main spectroscopic techniques for investigating the electronic properties of materials and interfaces between organic films and inorganic substrates.

Notes and presentations uploaded in Moodle
Reference Textbook:
K. Wandelt, Surface and Interface Science, Wiley, available online through Units credentials. (chapters from Vol. 1, 2, 5, 6. Precise indication will be given in class and on Moodle)

Ultra-High Vacuum: Techniques and Instrumentation Pumping technology: primary, turbomolecular, ionic, getter pumps. Procedure to reach UHV conditions. Vacuum measurement. Cleaning and preparation of samples. Molecular sources. Ion gun, sample temperature control. Control of the surfaces structure: LEED and RHEED. X-ray sources: synchrothron, anode X-ray source, UV gas discharge source, Laser. Beamline configuration and management. Photoemission. Photoelectric effect. Photoemission measurement, hemispherical electron analyzer. Detector of electrons. Pass energy and energy resolution. Three steps photoemission process. Chemical composition of the sample. Chemical shifts, satellite peaks and Shirley background. Auger emission and Auger spectroscopy. Photoelectron diffraction technique. Valence band states and introduction to the valence band dispersion. Near-Edge Absorption Spectroscopy (NEXAFS) Absorption measurement: total, Auger, fluorescence and partial yield. Determination of the orbitals symmetry and of the molecular orientation. Building block approach to the NEXAFS spectra analysis. Lineshape of absorption peaks. Molecule-substrate interaction and Fermi steps. Introduction to the Invers Photoemission Spectroscopy (IPES). Time-dependent spectroscopies. Principles of the Resonant Photoemission Spectroscopy applied to the molecules. Overlap between occupied and unoccupied orbitals, chemical assignment of electronic states. Ultra-fast charge delocalization, core-hole clock method. Laser and two-photon photoemission (2PP). Pump & Probe Spectroscopy Data Analysis and Data treatment. Gaussian, Lorentzian and Voigt distribution. Fitting procedures: background subtraction, experimental resolution, energy scale alignment. NEXAFS normalization procedure, interpolation of curves. Chi squared analysis. Data presentation. Laboratory: In-situ growth of ultra-thin organic film. Organic film characterization by means of one of the discussed spectroscopic techniques.

Classroom lectures will be given with support of Powerpoint presentation. Some scientific papers tackling the topics of the program will be commented in detail. Variations with respect to the described procedures and methods could be applied due to emergencies issues and will be notified in the website of the Department and in the Students Information section.

Attendance is required for at least 80% of the laboratory hours.

Oral exam. The aim is to verify the ability of the candidate to discuss the topics related to the main X-ray Spectroscopy techniques applied to the study of organo-metallic interfaces. Candidates are asked to present a report on their laboratory experience, including the analysis of the data collected and a discussion of the results obtained. Additionally, an article is assigned to be read, and the results are to be presented. The discussion will also cover topics discussed during the course, including experimental techniques other than those used in the laboratory. The exam score is assigned out of thirty. To pass the exam (18/30), the student must demonstrate an understanding of: the principles underlying the experimental techniques used in the laboratory; the data analysis methodology adopted; the results reported in the assigned article. To achieve the maximum score (30/30), the student must also demonstrate a thorough understanding of the models and techniques described during the course that were not used in the discussed article. Variations with respect to the described procedures and methods could be applied due to emergencies issues and will be notified in the website of the Department and in the Students Information section.